On-Line Testability in a Transformation-Based and Cost Function-Driven High-Level Synthesis Environment
On-Line Testability in a Transformation-Based and Cost Function-Driven High-Level Synthesis Environment
On-line testability is essential in designs with high reliability requirements. High-level synthesis reduces time-to-market and enables efficient design space exploration. In our work, we implement on-line testable designs in a high-level synthesis environment. We refer to our new technique (inversion testing) and exploit its features, in an attempt to reduce hardware penalties. Further, we enhance the design space by providing a metric for on-line testability.
Oikonomakos, Petros
2d4259bc-b7a3-4a68-af0f-cc680870e949
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
2002
Oikonomakos, Petros
2d4259bc-b7a3-4a68-af0f-cc680870e949
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Oikonomakos, Petros and Zwolinski, Mark
(2002)
On-Line Testability in a Transformation-Based and Cost Function-Driven High-Level Synthesis Environment.
UK ACM SIGDA Workshop on Electronic Design Automation, Bournemouth, United Kingdom.
16 - 17 Sep 2002.
Record type:
Conference or Workshop Item
(Poster)
Abstract
On-line testability is essential in designs with high reliability requirements. High-level synthesis reduces time-to-market and enables efficient design space exploration. In our work, we implement on-line testable designs in a high-level synthesis environment. We refer to our new technique (inversion testing) and exploit its features, in an attempt to reduce hardware penalties. Further, we enhance the design space by providing a metric for on-line testability.
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Published date: 2002
Additional Information:
Event Dates: 16-17 September 2002
Venue - Dates:
UK ACM SIGDA Workshop on Electronic Design Automation, Bournemouth, United Kingdom, 2002-09-16 - 2002-09-17
Organisations:
EEE
Identifiers
Local EPrints ID: 256785
URI: http://eprints.soton.ac.uk/id/eprint/256785
PURE UUID: b417d570-abec-432e-a24a-12f9311e5d81
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Date deposited: 27 Sep 2002
Last modified: 15 Mar 2024 02:39
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Contributors
Author:
Petros Oikonomakos
Author:
Mark Zwolinski
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