Comparison of arsenic diffusion in Si1-xGex formed by epitaxy and Ge+ implantation
Comparison of arsenic diffusion in Si1-xGex formed by epitaxy and Ge+ implantation
A comparison is made of arsenic diffusion in Si0.95Ge0.05 produced by epitaxy and ion beam synthesis using a 2 x 1016 cm-2 Ge+ implant into silicon. The arsenic diffusion depth at 1025 ºC in the Si0.95Ge0.05 epitaxy sample is enhanced by a factor of 1.26 compared with a similar Si control sample and by a factor of 1.30 in the ion beam synthesized sample. The arsenic diffusion in the Si0.95 Ge0.05 epitaxy sample is modeled by increasing the arsenic diffusion coefficient from the Si value of 1.92 x 10-15 to 5.15x10-15 cm2 s-1, and in the ion beam synthesized sample by using the same diffusion coefficient of 5.15x10-15 cm2 s-1 and increasing the "plus one" factor in the transient enhanced diffusion model from 0.01 to 1.5. Arsenic diffusion in a silicon sample implanted with 2x1015 cm-2 Si+ can be modeled using the same plus one factor of 1.5, thereby demonstrating the consistency of the modeling.
4526-4528
Mitchell, M J
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Ashburn, P
68cef6b7-205b-47aa-9efb-f1f09f5c1038
Bonar, J M
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Hemment, P L F
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May 2003
Mitchell, M J
c7920fa2-d772-4f14-88b0-d1a28712bf23
Ashburn, P
68cef6b7-205b-47aa-9efb-f1f09f5c1038
Bonar, J M
5ee6b25a-3e67-4a6d-9854-5e1e079d50b8
Hemment, P L F
94618b9c-dba6-4cf6-b4d9-8770e7081532
Mitchell, M J, Ashburn, P, Bonar, J M and Hemment, P L F
(2003)
Comparison of arsenic diffusion in Si1-xGex formed by epitaxy and Ge+ implantation.
Journal of Applied Physics, 93 (9), .
Abstract
A comparison is made of arsenic diffusion in Si0.95Ge0.05 produced by epitaxy and ion beam synthesis using a 2 x 1016 cm-2 Ge+ implant into silicon. The arsenic diffusion depth at 1025 ºC in the Si0.95Ge0.05 epitaxy sample is enhanced by a factor of 1.26 compared with a similar Si control sample and by a factor of 1.30 in the ion beam synthesized sample. The arsenic diffusion in the Si0.95 Ge0.05 epitaxy sample is modeled by increasing the arsenic diffusion coefficient from the Si value of 1.92 x 10-15 to 5.15x10-15 cm2 s-1, and in the ion beam synthesized sample by using the same diffusion coefficient of 5.15x10-15 cm2 s-1 and increasing the "plus one" factor in the transient enhanced diffusion model from 0.01 to 1.5. Arsenic diffusion in a silicon sample implanted with 2x1015 cm-2 Si+ can be modeled using the same plus one factor of 1.5, thereby demonstrating the consistency of the modeling.
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2003_Michele_As_diffusion.pdf
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Published date: May 2003
Organisations:
Nanoelectronics and Nanotechnology
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Local EPrints ID: 257445
URI: http://eprints.soton.ac.uk/id/eprint/257445
ISSN: 0021-8979
PURE UUID: f1cabb4c-1e7a-4acf-ba61-b3fd6939b1f0
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Date deposited: 22 Dec 2003
Last modified: 14 Mar 2024 05:58
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Author:
M J Mitchell
Author:
J M Bonar
Author:
P L F Hemment
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