Are neural network techniques the solution to measurement validation, monitoring and automatic diagnosis of sensor faults?


Gaura, E and Kraft, Michael (2002) Are neural network techniques the solution to measurement validation, monitoring and automatic diagnosis of sensor faults? 41st SICE Annual Conference (SICE2002), Osaka,

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: Event Dates: August 2002
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 257816
Date Deposited: 26 Jun 2003
Last Modified: 27 Mar 2014 20:00
Further Information:Google Scholar
ISI Citation Count:0
URI: http://eprints.soton.ac.uk/id/eprint/257816

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