Are neural network techniques the solution to measurement validation, monitoring and automatic diagnosis of sensor faults?
Gaura, E and Kraft, Michael (2002) Are neural network techniques the solution to measurement validation, monitoring and automatic diagnosis of sensor faults? 41st SICE Annual Conference (SICE2002), Osaka,
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | Event Dates: August 2002 |
| Divisions: | Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO |
| Item ID: | 257816 |
| Date Deposited: | 26 Jun 2003 |
| Last Modified: | 01 Mar 2012 10:53 |
| Contributors: | Gaura, E (Author) Kraft, Michael (Author) |
| Date: | 2002 |
| Additional Information: | Event Dates: August 2002 |
| Status: | Published |
| Further Information: | Google Scholar |
| ISI Citation Count: | 0 |
| URI: | http://eprints.soton.ac.uk/id/eprint/257816 |
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