New Area Based Metrics for Automatic Gait Recognition
Foster, Jeff P., Nixon, Mark S. and Prudel-Bennett, Adam (2001) New Area Based Metrics for Automatic Gait Recognition. In, British Machine Vision Conference , 233-242.
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Description/Abstract
Gait is a new biometric aimed to recognise a subject by the manner in which they walk. Gait has several advantages over other biometrics, most notably that it is non-invasive and perceivable at a distance when other biometrics are obscured. We present a new area based metric, called gait masks, which provides statistical data intimately related to the gait of the subject and motivated by medical studies. This provides the first statistical approach that can expose the dynamics of the change in area of a subject. Early results show promising results with a recognition rate of 90% on a standard database. Further, there appear to be performance advantages with respect to handling of noise associated with this new approach, together with capability for extension and generalisation. Future research will capitalise on the advantages of this new approach, together with analysis on a larger database.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Additional Information: | Event Dates: 2001 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > Comms, Signal Processing & Control |
| Item ID: | 258453 |
| Date Deposited: | 08 Dec 2003 |
| Last Modified: | 02 Mar 2012 11:57 |
| Contributors: | Foster, Jeff P. (Author) Nixon, Mark S. (Author) Prudel-Bennett, Adam (Author) |
| Date: | 2001 |
| Additional Information: | Event Dates: 2001 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/258453 |
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