Temperature effect on the space charge characteristics in as-received and degassed XLPE insulation under DC stressing condition
Ho, Y. F. F., Chong, Y. L. and Chen, G (2003) Temperature effect on the space charge characteristics in as-received and degassed XLPE insulation under DC stressing condition. In, IEEE Conference on Electrical Insulation and Dielectric Phenomena, Albuquerque, USA, 19 - 22 Oct 2003. IEEE, 241-244.
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Description/Abstract
This paper reports on an investigation into the effect of temperature on space charge dynamics in ~2 mm thick as-received and degassed XLPE plaques. The samples were stressed at 30 kV/mm under dc condition for 24 hours. Measurements of space charge profiles were made at various times using our newly automated laser induced pressure pulse (LIPP) system. Emphasis has been placed on the comparison of space charge characteristics between as-received and degassed XLPE plaques at four different temperatures (i.e. 25OC, 50OC, 70OC and 90OC). Significant difference in space charge dynamics has been observed between as-received and degassed samples. It has been found that temperature has an important effect on both the rate of space charge build up and the amount of charge formed in the bulk.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Additional Information: | Event Dates: October 19-22 |
| ISBNs: | 0780379101 |
| Keywords: | LIPP technique, space charge, effect of degassing treatment |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 258529 |
| Date Deposited: | 10 Nov 2003 |
| Last Modified: | 26 Apr 2013 02:59 |
| Contributors: | Ho, Y. F. F. (Author) Chong, Y. L. (Author) Chen, G (Author) |
| Date: | 2003 |
| Additional Information: | Event Dates: October 19-22 |
| Status: | Published |
| Publisher: | IEEE |
| Further Information: | Google Scholar |
| ISI Citation Count: | 0 |
| URI: | http://eprints.soton.ac.uk/id/eprint/258529 |
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