Temperature effect on the space charge characteristics in as-received and degassed XLPE insulation under DC stressing condition


Ho, Y. F. F., Chong, Y. L. and Chen, G (2003) Temperature effect on the space charge characteristics in as-received and degassed XLPE insulation under DC stressing condition. In, IEEE Conference on Electrical Insulation and Dielectric Phenomena, Albuquerque, USA, 19 - 22 Oct 2003. IEEE, 241-244.

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Description/Abstract

This paper reports on an investigation into the effect of temperature on space charge dynamics in ~2 mm thick as-received and degassed XLPE plaques. The samples were stressed at 30 kV/mm under dc condition for 24 hours. Measurements of space charge profiles were made at various times using our newly automated laser induced pressure pulse (LIPP) system. Emphasis has been placed on the comparison of space charge characteristics between as-received and degassed XLPE plaques at four different temperatures (i.e. 25OC, 50OC, 70OC and 90OC). Significant difference in space charge dynamics has been observed between as-received and degassed samples. It has been found that temperature has an important effect on both the rate of space charge build up and the amount of charge formed in the bulk.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: October 19-22
ISBNs: 0780379101
Keywords: LIPP technique, space charge, effect of degassing treatment
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science
Faculty of Physical and Applied Science > Electronics and Computer Science > EEE
Item ID: 258529
Date Deposited: 10 Nov 2003
Last Modified: 26 Apr 2013 02:59
Contributors: Ho, Y. F. F. (Author)
Chong, Y. L. (Author)
Chen, G (Author)
Date: 2003
Additional Information: Event Dates: October 19-22
Status: Published
Publisher: IEEE
Further Information:Google Scholar
ISI Citation Count:0
URI: http://eprints.soton.ac.uk/id/eprint/258529

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