Power-Constrained Testing of VLSI Circuits
Nicolici, Nicola and Al-Hashimi, Bashir M. (2003) Power-Constrained Testing of VLSI Circuits, Kluwer Academic Publishers (Frontiers in Electronic Testing).
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Description/Abstract
This book is the first book that covers all asopects of power-constrained test solutions. It is a reflection of authors own research and also survey of the major contributions in this domain.
| Item Type: | Book |
|---|---|
| Additional Information: | Forword by Dr Y. Zorian, Vice President & Chief Scientist, Virage Logic Corpo., California, USA |
| ISBNs: | 140207235 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > Electronic & Software Systems |
| Item ID: | 258533 |
| Date Deposited: | 11 Nov 2003 |
| Last Modified: | 02 Mar 2012 13:40 |
| Contributors: | Nicolici, Nicola (Author) Al-Hashimi, Bashir M. (Author) |
| Date: | February 2003 |
| Additional Information: | Forword by Dr Y. Zorian, Vice President & Chief Scientist, Virage Logic Corpo., California, USA |
| Status: | Published |
| Publisher: | Kluwer Academic Publishers |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/258533 |
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