Nicolici, Nicola and Al-Hashimi, Bashir M. (2003) Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing), Kluwer Academic Publishers
Record type:
Book
Abstract
This book is the first book that covers all asopects of power-constrained test solutions. It is a reflection of authors own research and also survey of the major contributions in this domain.
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More information
Published date: February 2003
Additional Information:
Forword by Dr Y. Zorian, Vice President & Chief Scientist, Virage Logic Corpo., California, USA
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 258533
URI: http://eprints.soton.ac.uk/id/eprint/258533
ISBN: 1-4020-7235-X
PURE UUID: 00c0fc62-d609-4498-bf98-796565fb24d8
Catalogue record
Date deposited: 11 Nov 2003
Last modified: 10 Dec 2021 20:56
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Contributors
Author:
Nicola Nicolici
Author:
Bashir M. Al-Hashimi
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