Power-Constrained Testing of VLSI Circuits
Nicolici, Nicola and Al-Hashimi, Bashir M. (2003) Power-Constrained Testing of VLSI Circuits, Kluwer Academic Publishers (Frontiers in Electronic Testing).
Full text not available from this repository.
This book is the first book that covers all asopects of power-constrained test solutions. It is a reflection of authors own research and also survey of the major contributions in this domain.
|Additional Information:||Forword by Dr Y. Zorian, Vice President & Chief Scientist, Virage Logic Corpo., California, USA|
|Divisions :||Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Electronic & Software Systems
|Accepted Date and Publication Date:||
|Date Deposited:||11 Nov 2003|
|Last Modified:||31 Mar 2016 13:59|
|Further Information:||Google Scholar|
|RDF:||RDF+N-Triples, RDF+N3, RDF+XML, Browse.|
Actions (login required)