Test Cost Reduction Through Compression


Gonciari, Paul Theo, Al-Hashimi, Bashi and Nicolici, Nicola (2003) Test Cost Reduction Through Compression. Electronics Systems and Software, 1, (3), 37-41.

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Item Type: Article
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Electronic & Software Systems
ePrint ID: 258684
Date Deposited: 15 Dec 2003
Last Modified: 27 Mar 2014 20:01
Publisher: IEE
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/258684

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