Test Cost Reduction Through Compression
Gonciari, Paul Theo, Al-Hashimi, Bashi and Nicolici, Nicola (2003) Test Cost Reduction Through Compression. Electronics Systems and Software, 1, (3), 37-41.
Download
Full text not available from this repository.
| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > Electronic & Software Systems |
| Item ID: | 258684 |
| Date Deposited: | 15 Dec 2003 |
| Last Modified: | 02 Mar 2012 12:58 |
| Contributors: | Gonciari, Paul Theo (Author) Al-Hashimi, Bashi (Author) Nicolici, Nicola (Author) |
| Date: | June 2003 |
| Status: | Published |
| Publisher: | IEE |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/258684 |
Actions (login required)
 |
View Item |
