Test Cost Reduction Through Compression

Gonciari, Paul Theo, Al-Hashimi, Bashi and Nicolici, Nicola (2003) Test Cost Reduction Through Compression. Electronics Systems and Software, 1, (3), 37-41.


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Item Type: Article
Divisions : Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Electronic & Software Systems
ePrint ID: 258684
Accepted Date and Publication Date:
June 2003Published
Date Deposited: 15 Dec 2003
Last Modified: 31 Mar 2016 13:59
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/258684

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