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Quantification, modelling and design for signal history dependent effects in mixed-signal SOS/SOI circuits

Quantification, modelling and design for signal history dependent effects in mixed-signal SOS/SOI circuits
Quantification, modelling and design for signal history dependent effects in mixed-signal SOS/SOI circuits
Starting from the basis that device matching is central to most analogue designs, the effects of static and dynamic signal history dependence on post-radiation device characteristics and analogue circuit cell performance are examined. The effects of unbalanced static and dynamic bias signals on matched devices subject to radiation is studied. Behavioural models for comparator cells and complete analogue to digital (A/D) converters are developed to assess the impact at cell and system level. New circuit design techniques are used too in the implementation of a 7-bit flash A/D converter fabricated in 1.5 µm SOI/SOS CMOS; and measurements confirm that performance remains consistent up to very high dose levels.
315-320
Edwards, C.F.
71a5b071-582c-45d1-91a6-b50366b5c46c
Redman-White, W.
d5376167-c925-460f-8e9c-13bffda8e0bf
Bracey, M.
66559002-8d42-41c2-ab67-539895677094
Tenbroek, B.M.
321ed915-008d-4218-9564-57e061886804
Lee, M.S.L.
6460a2db-498f-49de-b52e-9c134b9cf54d
Uren, M.J.
98cd13fc-b6fa-4126-8ef3-f5fc8be04710
Brunson, K.M.
7063d0f7-608e-4f9f-beb6-5002d29bc07a
Edwards, C.F.
71a5b071-582c-45d1-91a6-b50366b5c46c
Redman-White, W.
d5376167-c925-460f-8e9c-13bffda8e0bf
Bracey, M.
66559002-8d42-41c2-ab67-539895677094
Tenbroek, B.M.
321ed915-008d-4218-9564-57e061886804
Lee, M.S.L.
6460a2db-498f-49de-b52e-9c134b9cf54d
Uren, M.J.
98cd13fc-b6fa-4126-8ef3-f5fc8be04710
Brunson, K.M.
7063d0f7-608e-4f9f-beb6-5002d29bc07a

Edwards, C.F., Redman-White, W., Bracey, M., Tenbroek, B.M., Lee, M.S.L., Uren, M.J. and Brunson, K.M. (1999) Quantification, modelling and design for signal history dependent effects in mixed-signal SOS/SOI circuits. Fifth European Conference on Radiation and Its Effects on Components and Systems, , Fontevraud, France. 13 - 17 Sep 1999. pp. 315-320 .

Record type: Conference or Workshop Item (Paper)

Abstract

Starting from the basis that device matching is central to most analogue designs, the effects of static and dynamic signal history dependence on post-radiation device characteristics and analogue circuit cell performance are examined. The effects of unbalanced static and dynamic bias signals on matched devices subject to radiation is studied. Behavioural models for comparator cells and complete analogue to digital (A/D) converters are developed to assess the impact at cell and system level. New circuit design techniques are used too in the implementation of a 7-bit flash A/D converter fabricated in 1.5 µm SOI/SOS CMOS; and measurements confirm that performance remains consistent up to very high dose levels.

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More information

Published date: September 1999
Venue - Dates: Fifth European Conference on Radiation and Its Effects on Components and Systems, , Fontevraud, France, 1999-09-13 - 1999-09-17
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 259914
URI: http://eprints.soton.ac.uk/id/eprint/259914
PURE UUID: 494d6b9b-9500-4537-a8d5-c86954486585

Catalogue record

Date deposited: 08 Sep 2004
Last modified: 10 Dec 2021 21:07

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Contributors

Author: C.F. Edwards
Author: W. Redman-White
Author: M. Bracey
Author: B.M. Tenbroek
Author: M.S.L. Lee
Author: M.J. Uren
Author: K.M. Brunson

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