Quantification, Modelling and Design for Signal History Dependent Effects in Mixed-Signal SOS/SOI Circuits


Edwards, C. F., Redman-White, W., Bracey, M., Tenbroek, B. M., Lee, M. S. L., Uren, M. J. and Brunson, K. M. (1999) Quantification, Modelling and Design for Signal History Dependent Effects in Mixed-Signal SOS/SOI Circuits. In, Fifthe European Conference on Radiation and Its Effects on Components and Systems (RADECS 99), Fontevraud, France, 13 - 17 Sep 1999. , 315-320.

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Description/Abstract

Starting from the basis that device matching is central to most analogue designs, the effects of static and dynamic signal history dependence on post-radiation device characteristics and analogue circuit cell performance are examined. The effects of unbalanced static and dynamic bias signals on matched devices subject to radiation is studied. Behavioural models for comparator cells and complete analogue to digital (A/D) converters are developed to assess the impact at cell and system level. New circuit design techniques are used too in the impletmentation of a 7-bit flash A/D converter fabricated in 1.5 um SOI/SOS CMOS; and measurements confirm that performance remains consistent up to very high does levels.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: 13th-17th September 1999
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 259914
Date Deposited: 08 Sep 2004
Last Modified: 02 Mar 2012 13:20
Contributors: Edwards, C. F. (Author)
Redman-White, W. (Author)
Bracey, M. (Author)
Tenbroek, B. M. (Author)
Lee, M. S. L. (Author)
Uren, M. J. (Author)
Brunson, K. M. (Author)
Date: 1999
Additional Information: Event Dates: 13th-17th September 1999
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/259914

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