Rapid generation of thermal-safe test schedules


Rosinger, Paul, Al-Hashimi, Bashir and Chakrabarty, Krishnendu (2005) Rapid generation of thermal-safe test schedules. In, Design Automation and Test in Europe (DATE), Munich, Germany, 07 - 11 Mar 2005. IEEE.

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Description/Abstract

Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have been recently proposed to tackle this problem. However, as it will be shown in this paper, imposing a chip-level maximum power constraint doesn't necessarily avoid local overheating due to the non-uniform distribution of power across the chip. This paper proposes a new approach for dealing with overheating during test, by embedding thermal awareness into test scheduling. The proposed approach facilitates rapid generation of thermal-safer test schedules without requiring time-consuming thermal simulations. This is achieved by employing a low-complexity test session thermal model used to guide the test schedule generation algorithm. This approach reduces the chances of a design re-spin due to potential overheating during test.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: 7-11 March 2005
Keywords: DFT, test, low power
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Electronic & Software Systems
ePrint ID: 260180
Date Deposited: 07 Dec 2004
Last Modified: 27 Mar 2014 20:02
Publisher: IEEE
Further Information:Google Scholar
ISI Citation Count:9
URI: http://eprints.soton.ac.uk/id/eprint/260180

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