Behavioural Modelling, Simulation, Test and Diagnosis of MEMS using ANNs


Litovski, V, Andrejević, M and Zwolinski, M (2005) Behavioural Modelling, Simulation, Test and Diagnosis of MEMS using ANNs. In, International Symposium on Circuits and Systems, Kobe, Japan, 23 - 26 May 2005. IEEE.

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Description/Abstract

The design of Micro-Electrical-Mechanical Systems requires that the entire system can be modelled and simulated. Additionally, behaviour under fault conditions must be simulated to determine test and diagnosis strategies. While the electrical parts of a system can be modelled at transistor, gate or behavioural levels, the mechanical parts are conventionally modelled in terms of partial differential equations (PDEs). Mixed-signal electrical simulations are possible, using e.g. VHDL-AMS, but simulations that include PDEs are prohibitively expensive. Here, we show that complex PDEs can be replaced by black-box functional models and, importantly, such models can be characterized automatically and rapidly using artificial neural networks (ANNs). We demonstrate a significant increase in simulation speed and show that test and diagnosis strategies can be derived using such models.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: 23-26 May 2005
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
ePrint ID: 260432
Date Deposited: 03 Feb 2005
Last Modified: 27 Mar 2014 20:03
Publisher: IEEE
Further Information:Google Scholar
ISI Citation Count:0
URI: http://eprints.soton.ac.uk/id/eprint/260432

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