GSMBE growth and structural characterisation of SiGeC layers for HBT


Zhang, J, Neave, J H, Li, X B, Fewster, P F, El Mubarek, H A W, Ashburn, P, Mitrovic, I Z, Buiu, O and Hall, S (2004) GSMBE growth and structural characterisation of SiGeC layers for HBT. MBE2004

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Item Type: Article
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 260765
Date Deposited: 14 Apr 2005
Last Modified: 01 Mar 2012 11:08
Contributors: Zhang, J (Author)
Neave, J H (Author)
Li, X B (Author)
Fewster, P F (Author)
El Mubarek, H A W (Author)
Ashburn, P (Author)
Mitrovic, I Z (Author)
Buiu, O (Author)
Hall, S (Author)
Date: August 2004
Status: Published
Further Information:Google Scholar
ISI Citation Count:1
URI: http://eprints.soton.ac.uk/id/eprint/260765

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