Wavelet analysis of coarsening during unstable MBE growth
Moktadir, Zak and Kraft, Michael (2005) Wavelet analysis of coarsening during unstable MBE growth. Microelectronics Journal, 36, (Issues), 601-604.
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Description/Abstract
We present a wavelet analysis of coarsening of mounds during molecular beam epitaxy. The advantage in using wavelets over Fourier analysis is that one can track the coarsening process in both, location (direct space) and frequency (or scale) space at the same time. The wavelets concise scale decomposition allows the discrimination of the coarening process i.e. tracking coarsening at different scales.
| Item Type: | Article |
|---|---|
| Keywords: | Wavelets, MBE growth, Coarsening, Continuum model |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 260878 |
| Date Deposited: | 17 May 2005 |
| Last Modified: | 01 Mar 2012 11:09 |
| Contributors: | Moktadir, Zak (Author) Kraft, Michael (Author) |
| Date: | March 2005 |
| Status: | Published |
| Further Information: | Google Scholar |
| ISI Citation Count: | 0 |
| URI: | http://eprints.soton.ac.uk/id/eprint/260878 |
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- Wavelet analysis of coarsening during unstable MBE growth. (deposited 17 May 2005) [Currently Displayed]
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