Further advances in applying continuum design sensitivity analysis in combination with commercial electromagnetic software to aid design optimization
Kim, Dong-Hun, Sykulski, J.K., Lowther, D., Choi, Jong-Woo and Kim, Tae-Young (2005) Further advances in applying continuum design sensitivity analysis in combination with commercial electromagnetic software to aid design optimization. In, COMPUMAG, Shenyang, China, 26 - 30 Jun 2005. , 184-185.
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Additional Information: | Event Dates: 26-30 June 2005 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 261047 |
| Date Deposited: | 06 Jul 2005 |
| Last Modified: | 02 Mar 2012 12:20 |
| Contributors: | Kim, Dong-Hun (Author) Sykulski, J.K. (Author) Lowther, D. (Author) Choi, Jong-Woo (Author) Kim, Tae-Young (Author) |
| Date: | 2005 |
| Additional Information: | Event Dates: 26-30 June 2005 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/261047 |
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