X-ray image processing for high voltage cable inspection

Robinson, A P, Lewin, P L, Swingler, S G and Sutton, S J (2005) X-ray image processing for high voltage cable inspection. IEE Proceedings: Science Measurement and Technology, 152, (4), 187-195.


[img] PDF
Restricted to Registered users only

Download (912Kb) | Request a copy


High voltage polymeric cables can be insulated using an automated extrusion process to a predefined standard up to a maximum continuous length. For longer cables, lengths are joined together manually. Consequently, the manufacturing quality of the cable joint is likely to be lower than that of the cable; therefore joints must be assessed prior to energisation. One method of manually inspecting joints uses conventional X-ray techniques. This could be automated using digital technology and image processing techniques. One possible sensor that could be used to replace the film would be a CCD camera coupled to a scintillating screen. Two post-processing algorithms for inspection of the digital images produced have been implemented; these are a statistical approach using mean, variance, skewness and kurtosis, and a method that equates pixels to Newtonian bodies. In order to verify that digital X-raying of cable joints is a feasible inspection procedure, CCD camera and film images have been taken of three test pieces. The film-based images were converted into a digital format using a high-resolution scanner. Both sets of images were processed using the algorithms. The results of this test show that images generated by the camera are more distinct than film.

Item Type: Article
ISSNs: 1350-2344
Divisions : Faculty of Physical Sciences and Engineering > Electronics and Computer Science
Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
ePrint ID: 261105
Accepted Date and Publication Date:
July 2005Published
Date Deposited: 04 Aug 2005
Last Modified: 31 Mar 2016 14:03
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/261105

Actions (login required)

View Item View Item