The Influence of Residue on Space Charge Accumulation in Purposely Modified Thick Plaque XLPE Sample for DC Application
Fu, M, Chen, G and Fothergill, J C (2005) The Influence of Residue on Space Charge Accumulation in Purposely Modified Thick Plaque XLPE Sample for DC Application. In, 14th International Symposium on High Voltage Engineering, Beijing, China, 25 - 29 Aug 2005. Tsinghua University Press, CD-ROM.
Effects residues (cross-linking by-products and additives) in polyethylene on space charge accumulation and decay have been investigated using the pulsed electro-acoustic technique. Space charge profiles have shown a great variation both in the charge initiation during the voltage ramping-up process and during long term stressing and decay (volts off). Samples were subjected to different conditioning processes, resulting in different proportions of residues (fresh, 0.5% residue and thoroughly degassed). The results show that residual impurities, including the by-products of cross-linking, play a key role in the space charge accumulation in cross-linked polyethylene. On the removal of impurities by degassing, a small homocharge build up was found in the vicinity of the electrode. It is concluded that space charge accumulation is governed by the charge injection through dielectric/electrode interface when the sample is thoroughly degassed.
|Item Type:||Conference or Workshop Item (Paper)|
|Additional Information:||Event Dates: August 25 - 29, 2005|
|Keywords:||Space charge; Cross-linking by-products; XLPE and PEA|
|Divisions:||Faculty of Physical Sciences and Engineering > Electronics and Computer Science
Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
|Date Deposited:||19 Dec 2005|
|Last Modified:||27 Mar 2014 20:04|
|Publisher:||Tsinghua University Press|
|Further Information:||Google Scholar|
|RDF:||RDF+N-Triples, RDF+N3, RDF+XML, Browse.|
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