A comparative study of different thick photoresists for MEMS applications


Koukharenko, E., Kraft, M., Ensell, G. and Hollinshead, N. (2005) A comparative study of different thick photoresists for MEMS applications. Journal of Materials Science: Materials in Electronics, 16, (11-12), 741-747.

Download

Full text not available from this repository.

Item Type: Article
ISSNs: 0957-4522
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 261723
Date Deposited: 22 Dec 2005
Last Modified: 01 Mar 2012 11:13
Contributors: Koukharenko, E. (Author)
Kraft, M. (Author)
Ensell, G. (Author)
Hollinshead, N. (Author)
Date: November 2005
Status: Published
Further Information:Google Scholar
ISI Citation Count:8
URI: http://eprints.soton.ac.uk/id/eprint/261723

Actions (login required)

View Item View Item