On Applying Boolean Satisfiability to Delay Fault Testing


Kim, J., Whittemore, J., Marques-Silva, J. P. and Sakallah, K. A. (2000) On Applying Boolean Satisfiability to Delay Fault Testing. In, Proceedings of the Design, Automation and Test in Europe Conference, Munich, Germany, , 380-384.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: March 2000
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science
Item ID: 262033
Date Deposited: 02 Mar 2006
Last Modified: 02 Mar 2012 13:42
Contributors: Kim, J. (Author)
Whittemore, J. (Author)
Marques-Silva, J. P. (Author)
Sakallah, K. A. (Author)
Date: March 2000
Additional Information: Event Dates: March 2000
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/262033

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