Cost Model-Driven Test Resource Partitioning for SoCs

Abstract

The increasing complexity of modern SoCs and quality expectations are making the cost of test represent an significant fraction of the manufacturing cost. The main factors contributing to the cost of test are the required number of tester pins, the test application time, the tester memory requirements and the area overhead required by the test resources. These factors contribute with different weights, depending on the cost model of each product. Several methods have been proposed to optimize each of these factors, however none of them allows an objective function derived from the actual cost model of each product. In this paper, we propose a cost model-driven test resource allocation and scheduling method that minimizes the cost of test.

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