Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes.


Vaughan, A S, Chen, G, Lewin, P L, Dodd, S J and Swingler, S G (2006) Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes. In, IET Seminar on Challenges in the Modelling and Measurement of Electromagnetic Materials, Savoy Place, London, UK, 25 - 26 Oct 2006. IET, 29-32.

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Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: 25-26 October 2006
ISBNs: 0863416950
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science
Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
ePrint ID: 263228
Date Deposited: 05 Dec 2006
Last Modified: 27 Mar 2014 20:06
Publisher: IET
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/263228

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