Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes.
Vaughan, A S, Chen, G, Lewin, P L, Dodd, S J and Swingler, S G (2006) Dielectric Ageing: Materials, Measurements and Modelling of Nano- to Meso-Scale Processes. In, IET Seminar on Challenges in the Modelling and Measurement of Electromagnetic Materials, Savoy Place, London, UK, 25 - 26 Oct 2006. IET, 29-32.
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Additional Information: | Event Dates: 25-26 October 2006 |
| ISBNs: | 0863416950 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 263228 |
| Date Deposited: | 05 Dec 2006 |
| Last Modified: | 01 Mar 2012 21:37 |
| Contributors: | Vaughan, A S (Author) Chen, G (Author) Lewin, P L (Author) Dodd, S J (Author) Swingler, S G (Author) |
| Date: | 2006 |
| Additional Information: | Event Dates: 25-26 October 2006 |
| Status: | Published |
| Publisher: | IET |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/263228 |
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