Enhancing delay fault coverage through low power segmented scan
Zhang, Zhuo, Reddy, Sudhakar M., Pomeranz, Irith, Rajski, Janusz and Al-Hashimi, Bashir M. (2007) Enhancing delay fault coverage through low power segmented scan. IEE Proceedings: Computer and Digital Techniques
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| Item Type: | Article |
|---|---|
| Keywords: | Low-power test, segmented scan, delay fault |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > Electronic & Software Systems |
| Item ID: | 263317 |
| Date Deposited: | 15 Jan 2007 |
| Last Modified: | 02 Mar 2012 14:03 |
| Contributors: | Zhang, Zhuo (Author) Reddy, Sudhakar M. (Author) Pomeranz, Irith (Author) Rajski, Janusz (Author) Al-Hashimi, Bashir M. (Author) |
| Date: | July 2007 |
| Status: | Published |
| Publisher: | IEE Proceedings: Computer and Digital Techniques |
| Further Information: | Google Scholar |
| ISI Citation Count: | 1 |
| URI: | http://eprints.soton.ac.uk/id/eprint/263317 |
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