ANN based modeling, testing and diagnosis of MEMS
Litovski, V, Andrejevic, M and Zwolinski, M (2004) ANN based modeling, testing and diagnosis of MEMS. In, NEUREL 2004: SEVENTH SEMINAR ON NEURAL NETWORK APPLICATIONS IN ELECTRICAL ENGINEERING, Belgrade, Serbia, 23 - 25 Sep 2004. IEEE, 183-188.
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Description/Abstract
New concepts of simulation, testing and diagnosis of MEMS are proposed, intended to boost the time to market and dependability of such systems. Black-box modeling of non-electronic parts is introduced using artificial neural networks, so enabling radically faster simulation without concurrent algorithms and parallel computation. A Jumped model of the capacitive transducer, being the part of a micro-electro-mechanical capacitive pressure sensing system, is created using an ANN. Faults are then introduced to the sensing system and simulation of the fault-free and faulty circuits are demonstrated.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Additional Information: | Event Dates: SEP 23-25, 2004 |
| ISBNs: | 0780385470 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 263413 |
| Date Deposited: | 12 Feb 2007 |
| Last Modified: | 18 Aug 2012 04:06 |
| Contributors: | Litovski, V (Author) Andrejevic, M (Author) Zwolinski, M (Author) |
| Date: | 2004 |
| Additional Information: | Event Dates: SEP 23-25, 2004 |
| Status: | Published |
| Publisher: | IEEE |
| Further Information: | Google Scholar |
| ISI Citation Count: | 0 |
| URI: | http://eprints.soton.ac.uk/id/eprint/263413 |
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