ANN based modeling, testing and diagnosis of MEMS
Litovski, V, Andrejevic, M and Zwolinski, M (2004) ANN based modeling, testing and diagnosis of MEMS. In, NEUREL 2004: SEVENTH SEMINAR ON NEURAL NETWORK APPLICATIONS IN ELECTRICAL ENGINEERING, Belgrade, Serbia, 23 - 25 Sep 2004. IEEE, 183-188.
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New concepts of simulation, testing and diagnosis of MEMS are proposed, intended to boost the time to market and dependability of such systems. Black-box modeling of non-electronic parts is introduced using artificial neural networks, so enabling radically faster simulation without concurrent algorithms and parallel computation. A Jumped model of the capacitive transducer, being the part of a micro-electro-mechanical capacitive pressure sensing system, is created using an ANN. Faults are then introduced to the sensing system and simulation of the fault-free and faulty circuits are demonstrated.
|Item Type:||Conference or Workshop Item (Paper)|
|Additional Information:||Event Dates: SEP 23-25, 2004|
|Divisions:||Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
|Date Deposited:||12 Feb 2007|
|Last Modified:||27 Mar 2014 20:07|
|Further Information:||Google Scholar|
|ISI Citation Count:||0|
|RDF:||RDF+N-Triples, RDF+N3, RDF+XML, Browse.|
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