Electrical treeing in polyethylene: analysis by confocal Raman microprobe spectroscopy
Vaughan, A. S., Dodd, S. J. and Sutton, S. J. (2003) Electrical treeing in polyethylene: analysis by confocal Raman microprobe spectroscopy. In, 2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, Albuquerque, NM, USA, 19 - 22 Oct 2003. IEEE, 534-537.
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Additional Information: | Event Dates: 19-22 October 2003 Organisation: IEEE Dielectrics and Insulation Society |
| ISBNs: | 0780379101 |
| Divisions: | Faculty of Physical Sciences and Engineering > Electronics and Computer Science Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE |
| Item ID: | 263667 |
| Date Deposited: | 07 Mar 2007 |
| Last Modified: | 02 Mar 2012 13:20 |
| Contributors: | Vaughan, A. S. (Author) Dodd, S. J. (Author) Sutton, S. J. (Author) |
| Date: | October 2003 |
| Additional Information: | Event Dates: 19-22 October 2003 Organisation: IEEE Dielectrics and Insulation Society |
| Status: | Published |
| Publisher: | IEEE |
| Further Information: | Google Scholar |
| ISI Citation Count: | 0 |
| URI: | http://eprints.soton.ac.uk/id/eprint/263667 |
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