Rapid rotation of micron amd submicron dielectric particles measured using optical tweezers
Rowe, Alexander D, Leake, Mark C, Morgan, Hywel and Berry, Richard M (2003) Rapid rotation of micron amd submicron dielectric particles measured using optical tweezers. Journal of modern optics, 50, (10), 1539-1554.
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| Item Type: | Article |
|---|---|
| ISSNs: | 1362-3044 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 264526 |
| Date Deposited: | 19 Sep 2007 |
| Last Modified: | 02 Mar 2012 13:42 |
| Contributors: | Rowe, Alexander D (Author) Leake, Mark C (Author) Morgan, Hywel (Author) Berry, Richard M (Author) |
| Date: | 2003 |
| Status: | Published |
| Publisher: | Taylor & Francis Group |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/264526 |
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