Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models
Li, Weifeng, Feng, Yongfeng, Wilson, Peter, Mantooth, Alan, Santi, Enrico and Hudgins, Jerry (2008) Certify: A Parameter Extraction Tool for Power Device Semiconductor Device Models. In, Grand Challenges on Modeling and Simulation M&S Net, Edinburgh,
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| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Additional Information: | Event Dates: June 2008 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 265845 |
| Date Deposited: | 18 Jun 2008 22:21 |
| Last Modified: | 02 Mar 2012 11:59 |
| Contributors: | Li, Weifeng (Author) Feng, Yongfeng (Author) Wilson, Peter (Author) Mantooth, Alan (Author) Santi, Enrico (Author) Hudgins, Jerry (Author) |
| Date: | 18 June 2008 |
| Additional Information: | Event Dates: June 2008 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/265845 |
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