Performability/energy trade-off in error-control schemes for on-chip networks

Ejlali, Alireza, Al-Hashimi, Bashir M. , Rosinger, Paul, Miremadi, Seyed Ghassem and Benini, Luca (2010) Performability/energy trade-off in error-control schemes for on-chip networks. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 18, (1), 1-14. (doi:10.1109/TVLSI.2008.2000994).


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High reliability against noise, high performance, and low energy consumption are key objectives in the design of on-chip networks. Recently some researchers have considered the impact of various error-control schemes on these objectives and on the trade-off between them. In all these works performance and reliability are measured separately. However, we will argue in this paper that the use of error-control schemes in on-chip networks results in degradable systems, hence performance and reliability must be measured jointly using a unified measure, i.e., performability. Based on the traditional concept of performability, we provide a definition for the 'Interconnect Performability'. Analytical models are developed for interconnect performability and expected energy consumption. A detailed comparative analysis of the error-control schemes using the performability analytical models and SPICE simulations is provided taking into consideration voltage swing variations (used to reduce interconnect energy consumption) and variations in wire length. Furthermore, the impact of noise power and time constraint on the effectiveness of error-control schemes are analyzed

Item Type: Article
Digital Object Identifier (DOI): doi:10.1109/TVLSI.2008.2000994
ISSNs: 1063-8210
Keywords: low power, reliable on-chip netwprks
Divisions : Faculty of Physical Sciences and Engineering > Electronics and Computer Science > Electronic & Software Systems
ePrint ID: 265948
Accepted Date and Publication Date:
January 2010Published
Date Deposited: 16 Jun 2008 08:54
Last Modified: 31 Mar 2016 14:11
Next Generation Of Interconnection Technology For Multiprocessor SoC
Funded by: EPSRC (EP/C512804/1)
1 March 2005 to 29 February 2008
Further Information:Google Scholar

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