Patent: US 7,383,481: Method and apparatus for testing a functional circuit at speed
Warren, R and Mills, Rob (2008) Patent: US 7,383,481: Method and apparatus for testing a functional circuit at speed.
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| Item Type: | Other |
|---|---|
| Additional Information: | Patent granted by US Patent office on 3 June 2008 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 265999 |
| Date Deposited: | 26 Jun 2008 00:04 |
| Last Modified: | 02 Mar 2012 13:21 |
| Contributors: | Warren, R (Author) Mills, Rob (Author) |
| Date: | 3 June 2008 |
| Additional Information: | Patent granted by US Patent office on 3 June 2008 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/265999 |
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