Patent: US 7,383,481: Method and apparatus for testing a functional circuit at speed


Warren, R and Mills, Rob (2008) Patent: US 7,383,481: Method and apparatus for testing a functional circuit at speed.

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Item Type: Other
Additional Information: Patent granted by US Patent office on 3 June 2008
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
ePrint ID: 265999
Date Deposited: 26 Jun 2008 00:04
Last Modified: 27 Mar 2014 20:11
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/265999

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