Probing electron charging in nanocrystalline Si dots using Kelvin Probe Force Microscopy
Salem, M. A., Mizuta, Hiroshi and Oda, S. (2004) Probing electron charging in nanocrystalline Si dots using Kelvin Probe Force Microscopy. Applied Physics Letters, 85, 3262-3264.
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO |
| Item ID: | 266202 |
| Date Deposited: | 22 Jul 2008 08:13 |
| Last Modified: | 18 Aug 2012 04:10 |
| Contributors: | Salem, M. A. (Author) Mizuta, Hiroshi (Author) Oda, S. (Author) |
| Date: | 2004 |
| Status: | Published |
| Further Information: | Google Scholar |
| ISI Citation Count: | 21 |
| URI: | http://eprints.soton.ac.uk/id/eprint/266202 |
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