Probing electron charging in nanocrystalline Si dots using Kelvin Probe Force Microscopy


Salem, M. A., Mizuta, Hiroshi and Oda, S. (2004) Probing electron charging in nanocrystalline Si dots using Kelvin Probe Force Microscopy. Applied Physics Letters, 85, 3262-3264.

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Item Type: Article
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 266202
Date Deposited: 22 Jul 2008 08:13
Last Modified: 27 Mar 2014 20:11
Further Information:Google Scholar
ISI Citation Count:21
URI: http://eprints.soton.ac.uk/id/eprint/266202

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