Characterisation of tunnel barriers in polycrystalline silicon point-contact single-electron transistors


Furuta, Y., Mizuta, Hiroshi, Nakazato, K., Kamiya, T. , Tan, Y. T. , Durrani, Z. A. K. and Taniguchi, K. (2002) Characterisation of tunnel barriers in polycrystalline silicon point-contact single-electron transistors. Japanese Journal of Applied Physics, 41, 2675-2678.

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Item Type: Article
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 266211
Date Deposited: 22 Jul 2008 08:57
Last Modified: 27 Mar 2014 20:11
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266211

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