Characterisation of tunnel barriers in polycrystalline silicon point-contact single-electron transistors
Furuta, Y., Mizuta, Hiroshi, Nakazato, K., Kamiya, T. , Tan, Y. T. , Durrani, Z. A. K. and Taniguchi, K. (2002) Characterisation of tunnel barriers in polycrystalline silicon point-contact single-electron transistors. Japanese Journal of Applied Physics, 41, 2675-2678.
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 266211 |
| Date Deposited: | 22 Jul 2008 08:57 |
| Last Modified: | 02 Mar 2012 14:04 |
| Contributors: | Furuta, Y. (Author) Mizuta, Hiroshi (Author) Nakazato, K. (Author) Kamiya, T. (Author) Tan, Y. T. (Author) Durrani, Z. A. K. (Author) Taniguchi, K. (Author) |
| Date: | 2002 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/266211 |
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