Scaling of single-electron tunneling current through ultrasmall tunnel junction


Amakawa, S. , Hoh, K. , Fujishima, M. , Mizuta, Hiroshi and Tsukagoshi, K. (2000) Scaling of single-electron tunneling current through ultrasmall tunnel junction. Journal of Physics: Condensed Matter, 12, 7223-7228.

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Item Type: Article
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 266221
Date Deposited: 22 Jul 2008 09:24
Last Modified: 02 Mar 2012 12:21
Contributors: Amakawa, S. (Author)
Hoh, K. (Author)
Fujishima, M. (Author)
Mizuta, Hiroshi (Author)
Tsukagoshi, K. (Author)
Date: 2000
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266221

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