Study of charge quantization in individual silicon quantum dots using Kelvin probe Force Microscopy


Salem, M. A., Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S. (2004) Study of charge quantization in individual silicon quantum dots using Kelvin probe Force Microscopy. At the 2004 International Conference on Solid State Devices and Materials, Tokyo, , pp 884-885.

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Item Type: Conference or Workshop Item (Speech)
Additional Information: Event Dates: September 2004
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 266338
Date Deposited: 25 Jul 2008 08:34
Last Modified: 02 Mar 2012 12:59
Contributors: Salem, M. A. (Author)
Tsuchiya, Yoshishige (Author)
Usami, K. (Author)
Mizuta, Hiroshi (Author)
Oda, S. (Author)
Date: September 2004
Additional Information: Event Dates: September 2004
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266338

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