Study of charge quantization in individual silicon quantum dots using Kelvin probe Force Microscopy


Salem, M. A., Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S. (2004) Study of charge quantization in individual silicon quantum dots using Kelvin probe Force Microscopy. At the 2004 International Conference on Solid State Devices and Materials, Tokyo, , pp 884-885.

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Item Type: Conference or Workshop Item (Speech)
Additional Information: Event Dates: September 2004
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 266338
Date Deposited: 25 Jul 2008 08:34
Last Modified: 27 Mar 2014 20:11
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266338

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