AFM current imaging for surface oxidized nanocrystalline silicon dots
Salem, M. A. , Mizuta, Hiroshi, Oda, S., Fu, Y. and Willander, M. (2004) AFM current imaging for surface oxidized nanocrystalline silicon dots. At 2004 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies, Niigata, , p 241.
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| Item Type: | Conference or Workshop Item (Speech) |
|---|---|
| Additional Information: | Event Dates: June 2004 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 266339 |
| Date Deposited: | 25 Jul 2008 08:37 |
| Last Modified: | 02 Mar 2012 11:40 |
| Contributors: | Salem, M. A. (Author) Mizuta, Hiroshi (Author) Oda, S. (Author) Fu, Y. (Author) Willander, M. (Author) |
| Date: | June 2004 |
| Additional Information: | Event Dates: June 2004 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/266339 |
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