AFM current imaging for surface oxidized nanocrystalline silicon dots


Salem, M. A. , Mizuta, Hiroshi, Oda, S., Fu, Y. and Willander, M. (2004) AFM current imaging for surface oxidized nanocrystalline silicon dots. At 2004 International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies, Niigata, , p 241.

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Item Type: Conference or Workshop Item (Speech)
Additional Information: Event Dates: June 2004
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 266339
Date Deposited: 25 Jul 2008 08:37
Last Modified: 27 Mar 2014 20:11
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266339

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