A new approach to failure analysis and yield enhancement of very large-scale integrated systems


Amakawa, S., Nakazato, K. and Mizuta, Hiroshi (2002) A new approach to failure analysis and yield enhancement of very large-scale integrated systems. At 32th European Solid-State Device Research Conference, Firenze, , pp 147-150.

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Item Type: Conference or Workshop Item (Speech)
Additional Information: Event Dates: September 2002
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 266378
Date Deposited: 28 Jul 2008 08:19
Last Modified: 27 Mar 2014 20:11
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266378

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