A new approach to failure analysis and yield enhancement of very large-scale integrated systems
Amakawa, S., Nakazato, K. and Mizuta, Hiroshi (2002) A new approach to failure analysis and yield enhancement of very large-scale integrated systems. At 32th European Solid-State Device Research Conference, Firenze, , pp 147-150.
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| Item Type: | Conference or Workshop Item (Speech) |
|---|---|
| Additional Information: | Event Dates: September 2002 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 266378 |
| Date Deposited: | 28 Jul 2008 08:19 |
| Last Modified: | 02 Mar 2012 11:59 |
| Contributors: | Amakawa, S. (Author) Nakazato, K. (Author) Mizuta, Hiroshi (Author) |
| Date: | September 2002 |
| Additional Information: | Event Dates: September 2002 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/266378 |
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