Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM


Salem, M. A. , Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S. (2004) Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM. At 16th International Vacuum Congress, Venice,

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Item Type: Conference or Workshop Item (Speech)
Additional Information: Event Dates: June 2004
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 266390
Date Deposited: 28 Jul 2008 08:59
Last Modified: 27 Mar 2014 20:11
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266390

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