Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs


Ho, S., Oohira, M., Kagoya, O., Moriyoshi, A., Mizuta, Hiroshi and Yamaguchi, K. (1993) Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs. At Int. Workshop on VLSI Process and Device Modeling, Nara,

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Item Type: Conference or Workshop Item (Speech)
Additional Information: Event Dates: July 1993
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
Item ID: 266431
Date Deposited: 30 Jul 2008 09:45
Last Modified: 06 Aug 2012 23:30
Contributors: Ho, S. (Author)
Oohira, M. (Author)
Kagoya, O. (Author)
Moriyoshi, A. (Author)
Mizuta, Hiroshi (Author)
Yamaguchi, K. (Author)
Date: July 1993
Additional Information: Event Dates: July 1993
Status: Published
Further Information:Google Scholar
ISI Citation Count:2
URI: http://eprints.soton.ac.uk/id/eprint/266431

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