Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs


Ho, S., Oohira, M., Kagoya, O., Moriyoshi, A., Mizuta, Hiroshi and Yamaguchi, K. (1993) Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs. At Int. Workshop on VLSI Process and Device Modeling, Nara,

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Item Type: Conference or Workshop Item (Speech)
Additional Information: Event Dates: July 1993
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 266431
Date Deposited: 30 Jul 2008 09:45
Last Modified: 27 Mar 2014 20:11
Further Information:Google Scholar
ISI Citation Count:2
URI: http://eprints.soton.ac.uk/id/eprint/266431

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