Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs


Ho, S., Oohira, M., Kagaya, O., Moriyoshi, A., Mizuta, Hiroshi and Yamaguchi, K. (1994) Dynamic simulation of multiple trapping processes and anomalous frequency dependence in GaAs MESFETs. IEICE Trans. Electron, E77-C, 187-193.

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Item Type: Article
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 266456
Date Deposited: 31 Jul 2008 08:17
Last Modified: 27 Mar 2014 20:11
Further Information:Google Scholar
ISI Citation Count:2
URI: http://eprints.soton.ac.uk/id/eprint/266456

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