Control of grains and grain coundaries in nano/plycrystalline silicon for single-electron device applications
Mizuta, Hiroshi, Furuta, Y., Kamiya, T., Tan, Y.T., Durrani, Z.A.K., Uno, S. and Nakazato, K. (2002) Control of grains and grain coundaries in nano/plycrystalline silicon for single-electron device applications. CREST FEMD News Letter, 4, (3), 5-6.
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 266477 |
| Date Deposited: | 01 Aug 2008 12:01 |
| Last Modified: | 02 Mar 2012 13:21 |
| Contributors: | Mizuta, Hiroshi (Author) Furuta, Y. (Author) Kamiya, T. (Author) Tan, Y.T. (Author) Durrani, Z.A.K. (Author) Uno, S. (Author) Nakazato, K. (Author) |
| Date: | 2002 |
| Status: | Published |
| Publisher: | JST (Japan Science and Technology) |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/266477 |
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