Control of grains and grain coundaries in nano/plycrystalline silicon for single-electron device applications


Mizuta, Hiroshi, Furuta, Y., Kamiya, T., Tan, Y.T., Durrani, Z.A.K., Uno, S. and Nakazato, K. (2002) Control of grains and grain coundaries in nano/plycrystalline silicon for single-electron device applications. CREST FEMD News Letter, 4, (3), 5-6.

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Item Type: Article
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 266477
Date Deposited: 01 Aug 2008 12:01
Last Modified: 27 Mar 2014 20:11
Publisher: JST (Japan Science and Technology)
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266477

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