Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM
Salem, M.A., Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S. (2004) Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM. CREST FEMD News Letter, 5, (4)
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 266480 |
| Date Deposited: | 01 Aug 2008 12:10 |
| Last Modified: | 02 Mar 2012 13:00 |
| Contributors: | Salem, M.A. (Author) Tsuchiya, Yoshishige (Author) Usami, K. (Author) Mizuta, Hiroshi (Author) Oda, S. (Author) |
| Date: | 2004 |
| Status: | Published |
| Publisher: | JST (Japan Science and Technology) |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/266480 |
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