Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM


Salem, M.A., Tsuchiya, Yoshishige, Usami, K., Mizuta, Hiroshi and Oda, S. (2004) Nanoscale Observation of Size and Potential for Charged Nanocrystalline Si Dots using KFM. CREST FEMD News Letter, 5, (4)

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Item Type: Article
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 266480
Date Deposited: 01 Aug 2008 12:10
Last Modified: 27 Mar 2014 20:11
Publisher: JST (Japan Science and Technology)
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/266480

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