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Voltage-limitation-free analytical single-electron transistor model incorporating the effects of spin-degenerate discrete energy states

Voltage-limitation-free analytical single-electron transistor model incorporating the effects of spin-degenerate discrete energy states
Voltage-limitation-free analytical single-electron transistor model incorporating the effects of spin-degenerate discrete energy states
A physically based analytical single-electron transistor (SET) model is proposed. This model virtually shows no voltage limitation in the scope of the orthodox theory, which makes it particularly suitable for hybrid simulation where the SET is biased by a current source. The model is verified against Monte Carlo simulation with excellent agreement and compared to existing models. It is found that our model is valid and accurate whatever the drain voltage and faster than reported models on the whole. A way to integrate into the model the effects of spin-degenerate quantum energy level discreteness, in the case of a silicon-based SET, is also introduced and observed quantum mechanical effects, such as negative differential conductance, are discussed.
0021-8979
54508
Pruvost, B
9e5e3a90-fe6f-467e-ac42-ebfca7811e57
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Oda, S
514339b3-f8de-4750-8d20-c520834b2477
Pruvost, B
9e5e3a90-fe6f-467e-ac42-ebfca7811e57
Mizuta, Hiroshi
f14d5ffc-751b-472b-8dba-c8518c6840b9
Oda, S
514339b3-f8de-4750-8d20-c520834b2477

Pruvost, B, Mizuta, Hiroshi and Oda, S (2008) Voltage-limitation-free analytical single-electron transistor model incorporating the effects of spin-degenerate discrete energy states. Journal of Applied Physics, 103 (5), 54508. (doi:10.1063/1.2838491).

Record type: Article

Abstract

A physically based analytical single-electron transistor (SET) model is proposed. This model virtually shows no voltage limitation in the scope of the orthodox theory, which makes it particularly suitable for hybrid simulation where the SET is biased by a current source. The model is verified against Monte Carlo simulation with excellent agreement and compared to existing models. It is found that our model is valid and accurate whatever the drain voltage and faster than reported models on the whole. A way to integrate into the model the effects of spin-degenerate quantum energy level discreteness, in the case of a silicon-based SET, is also introduced and observed quantum mechanical effects, such as negative differential conductance, are discussed.

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More information

Accepted/In Press date: 10 March 2008
Published date: 2008
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 266935
URI: http://eprints.soton.ac.uk/id/eprint/266935
ISSN: 0021-8979
PURE UUID: b64b644c-8fc0-4b49-8557-38b32a44e6db

Catalogue record

Date deposited: 21 Nov 2008 18:52
Last modified: 14 Mar 2024 08:38

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Contributors

Author: B Pruvost
Author: Hiroshi Mizuta
Author: S Oda

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