Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy
Kanjanachuchai, S, Tsuchiya, Yoshishige, Usami, K and Oda, S (2004) Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy. Microelectronic Engineering, 73-74, 615-619.
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 267422 |
| Date Deposited: | 29 May 2009 16:11 |
| Last Modified: | 02 Mar 2012 13:43 |
| Contributors: | Kanjanachuchai, S (Author) Tsuchiya, Yoshishige (Author) Usami, K (Author) Oda, S (Author) |
| Date: | 18 March 2004 |
| Status: | Published |
| Publisher: | Elsevier B.V. |
| Further Information: | Google Scholar |
| ISI Citation Count: | 1 |
| URI: | http://eprints.soton.ac.uk/id/eprint/267422 |
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