Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy


Kanjanachuchai, S, Tsuchiya, Yoshishige, Usami, K and Oda, S (2004) Nanocrystalline silicon dot displacement using speed-controlled tapping-mode atomic force microscopy. Microelectronic Engineering, 73-74, 615-619.

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Item Type: Article
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science > NANO
ePrint ID: 267422
Date Deposited: 29 May 2009 16:11
Last Modified: 27 Mar 2014 20:13
Publisher: Elsevier B.V.
Further Information:Google Scholar
ISI Citation Count:1
URI: http://eprints.soton.ac.uk/id/eprint/267422

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