Nanocrystalline silicon dots displacement using tapping-mode atomic force microscopy
Kanjanachuchai, S, Tsuchiya, Yoshishige, Usami, K and Oda, S (2003) Nanocrystalline silicon dots displacement using tapping-mode atomic force microscopy. In, Micro and Nano Engineering 2003, Cambridge, UK, 22 - 25 Sep 2003.
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| Item Type: | Conference or Workshop Item (Other) |
|---|---|
| Additional Information: | Event Dates: 22-25 September |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 267443 |
| Date Deposited: | 01 Jun 2009 15:10 |
| Last Modified: | 02 Mar 2012 13:00 |
| Contributors: | Kanjanachuchai, S (Author) Tsuchiya, Yoshishige (Author) Usami, K (Author) Oda, S (Author) |
| Date: | September 2003 |
| Additional Information: | Event Dates: 22-25 September |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/267443 |
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