Fault Tolerance Techniques for Hybrid CMOS/Nano Architecture
Melouki, Aissa, Srivastava, Saket and Al-Hashimi, Bashir (2009) Fault Tolerance Techniques for Hybrid CMOS/Nano Architecture. IET Computers & Digital Techniques (Submitted).
- Accepted Version
We propose two fault tolerance techniques for hybrid CMOS/nano architecture implementing logic functions as Look-Up Tables. We compare the efficiency of the proposed techniques with recently reported methods that use single coding schemes in tolerating high fault rates in nanoscale fabrics. Both proposed techniques are based on error correcting codes to tackle different fault rates. In the first technique, we implement a combined two dimensional coding scheme using Hamming and BCH codes to address fault rates greater than 5%. In the second technique, Hamming coding is complemented with Bad Line Exclusion technique to tolerate fault rates higher than the first proposed technique (up to 20%). We have also estimated the improvement that can be achieved in the circuit reliability in the presence of Don't Care Conditions. The area, latency and energy costs of the proposed techniques were also estimated in the CMOS domain.
|Divisions:||Faculty of Physical and Applied Science > Electronics and Computer Science > Electronic & Software Systems
|Date Deposited:||27 Aug 2009 16:01|
|Last Modified:||02 Mar 2012 12:40|
|Contributors:||Melouki, Aissa (Author)
Srivastava, Saket (Author)
Al-Hashimi, Bashir (Author)
|Date:||27 August 2009|
|Publisher:||IET Computers & Digital Techniques|
|Further Information:||Google Scholar|
|RDF:||RDF+N-Triples, RDF+N3, RDF+XML, Browse.|
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