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Partial Discharge Measurements for Spherical Cavities within Solid Dielectric Materials under Different Stress and Cavity Conditions

Partial Discharge Measurements for Spherical Cavities within Solid Dielectric Materials under Different Stress and Cavity Conditions
Partial Discharge Measurements for Spherical Cavities within Solid Dielectric Materials under Different Stress and Cavity Conditions
The measurement of partial discharge is used in the performance assessment of insulation systems of high voltage components. This paper describes the development of a test object consisting of a single spherical cavity within a dielectric material. The test object is used to experimentally study the effect of variable applied frequency, applied voltage magnitude and size on PD activity. The obtained measurement data are analyzed and presented. The variations in the measurement results can be interpreted as changes in cavity parameters that can be used for PD modeling. The obtained data gives more information on how PD activity behaves under different stress conditions and the cavity conditions.
978-1-4244-4559-2
CD-ROM
Illias, H
b40d9b5c-c24f-4d80-99ad-a15b1d7e029c
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Illias, H
b40d9b5c-c24f-4d80-99ad-a15b1d7e029c
Chen, G
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Lewin, P L
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e

Illias, H, Chen, G and Lewin, P L (2009) Partial Discharge Measurements for Spherical Cavities within Solid Dielectric Materials under Different Stress and Cavity Conditions. 2009 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Virginia Beach, Virginia, United States. 18 - 21 Oct 2009. CD-ROM .

Record type: Conference or Workshop Item (Paper)

Abstract

The measurement of partial discharge is used in the performance assessment of insulation systems of high voltage components. This paper describes the development of a test object consisting of a single spherical cavity within a dielectric material. The test object is used to experimentally study the effect of variable applied frequency, applied voltage magnitude and size on PD activity. The obtained measurement data are analyzed and presented. The variations in the measurement results can be interpreted as changes in cavity parameters that can be used for PD modeling. The obtained data gives more information on how PD activity behaves under different stress conditions and the cavity conditions.

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More information

Published date: 18 September 2009
Additional Information: Event Dates: 18-21 October 2009
Venue - Dates: 2009 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Virginia Beach, Virginia, United States, 2009-10-18 - 2009-10-21
Organisations: Electronics & Computer Science, EEE

Identifiers

Local EPrints ID: 268127
URI: http://eprints.soton.ac.uk/id/eprint/268127
ISBN: 978-1-4244-4559-2
PURE UUID: 45a7ff49-9224-4e8e-852c-1e219207596b
ORCID for P L Lewin: ORCID iD orcid.org/0000-0002-3299-2556

Catalogue record

Date deposited: 26 Oct 2009 23:56
Last modified: 15 Mar 2024 02:43

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Contributors

Author: H Illias
Author: G Chen
Author: P L Lewin ORCID iD

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