Mills, B, Chau, CF, Rogers, ETF, Grant-Jacob, J, Stebbings, SL, Praeger, M, de Paula, AM, Froud, CA, Chapman, RT, Butcher, TJ, Baumberg, JJ, Brocklesby, WS and Frey, JG
Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array.
APPLIED PHYSICS LETTERS, 93
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Using extreme ultraviolet (XUV) radiation from a high harmonic source, we observe diffraction from a single-layer self-assembled hexagonal array of 196 +/- 1.2 nm diameter polystyrene spheres. The Mie solution is used to predict the correct form factor for a single sphere and hence model the intensities of the observed diffraction peaks for the first three orders. By measuring the diffraction intensities in this way, we demonstrate a technique for obtaining the complex refractive index of a material at multiple wavelengths in the XUV from a single measurement. We present experimental results for polystyrene in the range of 25-30 nm.
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