Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array


Mills, B, Chau, CF, Rogers, ETF, Grant-Jacob, J, Stebbings, SL, Praeger, M, de Paula, AM, Froud, CA, Chapman, RT, Butcher, TJ, Baumberg, JJ, Brocklesby, WS and Frey, JG (2008) Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array. APPLIED PHYSICS LETTERS, 93

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Description/Abstract

Using extreme ultraviolet (XUV) radiation from a high harmonic source, we observe diffraction from a single-layer self-assembled hexagonal array of 196 +/- 1.2 nm diameter polystyrene spheres. The Mie solution is used to predict the correct form factor for a single sphere and hence model the intensities of the observed diffraction peaks for the first three orders. By measuring the diffraction intensities in this way, we demonstrate a technique for obtaining the complex refractive index of a material at multiple wavelengths in the XUV from a single measurement. We present experimental results for polystyrene in the range of 25-30 nm.

Item Type: Article
Additional Information: Imported from ISI Web of Science
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science
ePrint ID: 269685
Date Deposited: 21 Apr 2010 07:46
Last Modified: 27 Mar 2014 20:15
Further Information:Google Scholar
ISI Citation Count:2
URI: http://eprints.soton.ac.uk/id/eprint/269685

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