Reference free Chi 3 dispersion measurements in planar tantalum pentoxide waveguides
Chen, Ruiqi, Charlton, Martin and Lagoudakis, Pavlos (2009) Reference free Chi 3 dispersion measurements in planar tantalum pentoxide waveguides. Proceedings of SPIE - The International Society for Optical Engineering, 7420
Download
|
PDF
Download (2333Kb) |
Description/Abstract
We utilize analysis of third harmonic generation under femtosecond pulsed excitation as a reference free measurement method for third order nonlinear susceptibility (χ (3) or “Chi 3”) of planar waveguides. We investigate χ (3) dispersion in planar Ta2O5 waveguides at wavelengths either side of the telecoms window, obtaining a nonlinear coefficient of 2 ×10−13 esu, at 1550 nm. Our study indicates that χ (3) increases within the measured wavelength range due to a threephoton resonance of Ta2O5 electrons, revealing the potential of this material system in high speed integrated nonlinear optical switches for the telecommunications spectral window.
| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > NANO |
| Item ID: | 270977 |
| Date Deposited: | 04 May 2010 11:01 |
| Last Modified: | 02 Mar 2012 13:01 |
| Contributors: | Chen, Ruiqi (Author) Charlton, Martin (Author) Lagoudakis, Pavlos (Author) |
| Date: | 2 August 2009 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/270977 |
Actions (login required)
![]() |
View Item |


