On the use of Raman and FTIR Spectroscopy for the Analysis of Silica-based Nanofillers


Yeung, C, Gherbaz, G and Vaughan, A S (2010) On the use of Raman and FTIR Spectroscopy for the Analysis of Silica-based Nanofillers. In, 2010 Conference on Electrical Insulation and Dielectric Phenomena, Purdue University, West Lafayette, Indiana, USA, 17 - 20 Oct 2010. IEEE, 526-529.

Download

[img] PDF - Published Version
Restricted to Registered users only

Download (444Kb) | Request a copy

Description/Abstract

This paper details our research into the interfacial regions of nanocomposites, using vibrational spectroscopy to characterize the surface chemistry of differently modified particulate fillers. Results obtained from both nano- and micro-silica are reported as a function of silane treatment. Materials with varying surface concentrations of epoxide groups were produced by altering the chemical processing conditions. Raman spectroscopy is capable of providing qualitative data concerning the functionalization level, but the technique is incapable of providing absolute concentrations. Although FTIR should be capable of providing more quantitative data, anomalously high apparent concentrations are obtained, suggesting that the interactions occurring within dispersed particulate systems are rather more complex than implied by classical Beer Lambert behavior.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: 17 - 20 October 2010
ISSNs: 0048-9162
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science
Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE
ePrint ID: 271646
Date Deposited: 20 Oct 2010 13:43
Last Modified: 27 Mar 2014 20:17
Publisher: IEEE
Contact Email Address: asv@ecs.soton.ac.uk
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/271646

Actions (login required)

View Item View Item