Electrical and microstructural properties of Bi2-xSbxTe and Bix-xSbxTe2 thin foils obtained by the ultrarapid quenching process Journal of Materials science: Materials and Electronics 14 pp. 383-388.
Koukharenko, Elena, Frety, N, Shepelevich, VG and Tedenac, JC (2003) Electrical and microstructural properties of Bi2-xSbxTe and Bix-xSbxTe2 thin foils obtained by the ultrarapid quenching process Journal of Materials science: Materials and Electronics 14 pp. 383-388. Journal of Materials science: Materials and Electronics , 14, 383-388.
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| Item Type: | Article |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 271728 |
| Date Deposited: | 30 Nov 2010 15:50 |
| Last Modified: | 02 Mar 2012 13:22 |
| Contributors: | Koukharenko, Elena (Author) Frety, N (Author) Shepelevich, VG (Author) Tedenac, JC (Author) |
| Date: | 2003 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/271728 |
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