Electrical and microstructural properties of Bi2-xSbxTe and Bi1-xSbxTe2 thin foils obtained by the ultrarapid quenching process, the 4th International Conference on Material for Microelectronics and Nanoengineering, Finland, ESPOO 2002, pp. 93-96
Kukharenka, E, Frety, N, Shepelevich, VG and Tedenac, JC (2002) Electrical and microstructural properties of Bi2-xSbxTe and Bi1-xSbxTe2 thin foils obtained by the ultrarapid quenching process, the 4th International Conference on Material for Microelectronics and Nanoengineering, Finland, ESPOO 2002, pp. 93-96. At the 4th International Conference on Material for Microelectronics and Nanoengineering, , ESPOO , Finland, , 93-96.
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| Item Type: | Conference or Workshop Item (Speech) |
|---|---|
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science Faculty of Physical and Applied Science > Electronics and Computer Science > EEE |
| Item ID: | 271825 |
| Date Deposited: | 22 Dec 2010 11:21 |
| Last Modified: | 02 Mar 2012 12:22 |
| Contributors: | Kukharenka, E (Author) Frety, N (Author) Shepelevich, VG (Author) Tedenac, JC (Author) |
| Date: | 2002 |
| Status: | Published |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/271825 |
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