Statistical analysis of crosstalk-induced errors for on-chip interconnects


Halak, Basel and Yakovlev, Alex (2011) Statistical analysis of crosstalk-induced errors for on-chip interconnects. IET Computers & Digital Techniques, 5, (2)

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Item Type: Article
ISSNs: 1751-8601
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > EEE
Item ID: 272150
Date Deposited: 06 Apr 2011 10:19
Last Modified: 25 Aug 2012 02:29
Contributors: Halak, Basel (Author)
Yakovlev, Alex (Author)
Date: 2011
Status: Published
Contact Email Address: bh9@ecs.soton.ac.uk
Further Information:Google Scholar
ISI Citation Count:1
URI: http://eprints.soton.ac.uk/id/eprint/272150

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