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Beam-induced damage to graphene in the helium ion microscope

Boden, Stuart, Moktadir, Zakaria, Bagnall, Darren, Rutt, Harvey and Mizuta, Hiroshi (2011) Beam-induced damage to graphene in the helium ion microscope. In, Graphene 2011 Conference, Bilbao, Spain, 11 - 14 Apr 2011.

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Item Type:	Conference or Workshop Item (Paper)
Additional Information:	Event Dates: 11-14 April 2011
Related URLs:	http://www.phantomsnet.net/ima...ABoden.pdf
Divisions:	Faculty of Physical and Applied Science > Electronics and Computer Science > NANO
ePrint ID:	272304
Deposited On:	19 May 2011 10:03
Last Modified:	02 Mar 2012 14:06
Further Information:	Google Scholar

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