Failure mechanisms of polyimide and perfluoroalkoxy films under high frequency pulses


Yin, Weijun, Tao, Fengfeng, Zhao, Junwei, Chen, George and Schweickart, Daniel (2010) Failure mechanisms of polyimide and perfluoroalkoxy films under high frequency pulses. In, IEEE International Power Modulator and High Voltage Conference, Atkanta, GA, USA, 23 - 27 May 2010. IEEE, 45-50.

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Description/Abstract

Breakdown behaviors of polyimide and perfluoroalkoxy high temperature films under unipolar and bipolar repetitive pulses are investigated. A bipolar 20kV, 20 kHz and fast dV/dt pulse generator has been designed and built to study the impact of pulse frequency, pulse rise time, and pulse polarity and pulse duty cycles on breakdown strength of these films films. Space charge injection and decay processes are also investigated. Possible failure mechanisms are discussed.

Item Type: Conference or Workshop Item (Paper)
Additional Information: Event Dates: May 23 - 27, 2010
Divisions: Faculty of Physical Sciences and Engineering > Electronics and Computer Science
ePrint ID: 273231
Date Deposited: 23 Feb 2012 14:49
Last Modified: 27 Mar 2014 20:18
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/273231

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