Failure mechanisms of polyimide and perfluoroalkoxy films under high frequency pulses
Yin, Weijun, Tao, Fengfeng, Zhao, Junwei, Chen, George and Schweickart, Daniel (2010) Failure mechanisms of polyimide and perfluoroalkoxy films under high frequency pulses. In, IEEE International Power Modulator and High Voltage Conference, Atkanta, GA, USA, 23 - 27 May 2010. IEEE, 45-50.
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Description/Abstract
Breakdown behaviors of polyimide and perfluoroalkoxy high temperature films under unipolar and bipolar repetitive pulses are investigated. A bipolar 20kV, 20 kHz and fast dV/dt pulse generator has been designed and built to study the impact of pulse frequency, pulse rise time, and pulse polarity and pulse duty cycles on breakdown strength of these films films. Space charge injection and decay processes are also investigated. Possible failure mechanisms are discussed.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Additional Information: | Event Dates: May 23 - 27, 2010 |
| Divisions: | Faculty of Physical and Applied Science > Electronics and Computer Science |
| Item ID: | 273231 |
| Date Deposited: | 23 Feb 2012 14:49 |
| Last Modified: | 02 Mar 2012 11:42 |
| Contributors: | Yin, Weijun (Author) Tao, Fengfeng (Author) Zhao, Junwei (Author) Chen, George (Author) Schweickart, Daniel (Author) |
| Date: | 23 May 2010 |
| Additional Information: | Event Dates: May 23 - 27, 2010 |
| Status: | Published |
| Publisher: | IEEE |
| Further Information: | Google Scholar |
| URI: | http://eprints.soton.ac.uk/id/eprint/273231 |
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